Nova Measuring Instruments Ltd (NASDAQ: NVMI) develops and supplies advanced metrology and process control systems for the semiconductor manufacturing industry. The company’s core product line includes spectroscopic ellipsometry and scatterometry tools designed to measure film thickness, critical dimensions, overlay alignment and other key parameters that drive yield and performance in integrated circuit fabrication.
Founded in 1993 and headquartered in Rehovot, Israel, Nova Measuring Instruments has established itself as a critical partner to leading semiconductor foundries and device manufacturers. Its solutions address the stringent measurement requirements of logic, memory and specialty device nodes, enabling customers to monitor and optimize fabrication processes at the nanoscale.
Nova operates a global network of sales, service and R&D locations across North America, Europe and the Asia‐Pacific region. This footprint allows the company to deliver localized support and rapid response to customer needs, while also fostering close collaboration on next‐generation metrology challenges in advanced packaging and 3D architectures.
The company’s leadership team brings deep expertise in semiconductor process control, optics and data analytics. Nova holds a portfolio of patents covering measurement techniques and real‐time process monitoring, and continues to invest in innovation aimed at enhancing throughput, accuracy and integration with fab automation platforms.